Not only can this new instrument examine the physical characteristics of large parts, it can also evaluate the chemical and crystalline properties of the material.  Unlike most conventional SEM’s that only have one or two associated analytical tools, the new LC-SEM is unique in that it has a variety of analytical tools designed for nondestructive evaluation.  The LC-SEM is equipped with backscattered electron imaging, energy dispersive x-ray spectrometry (EDS), electron backscatter diffraction (EBSD), and Fourier-transform infrared spectrometry (FT-IR).  The instrument’s variable-pressure mode adds yet another degree of freedom that enables engineers and scientists to perform critical surface characterization studies of both conductive and non-conductive samples, including metals, ceramics, and intermetallics.   
This LC-SEM is a one-stop examination and analytical tool for almost any sample, ranging in size from a grain of sand to a diesel engine.  A sample can be fully examined with only one instrument, without cutting the sample and introducing new anomalies to the microstructure.  The chamber is also large enough for in-situ experiments such as wear and compression studies.   The Y-12 National Security Complex is currently using a new large-chamber scanning electron microscope (LC-SEM) to analyze large and unique components of advanced materials.  The LC-SEM, manufactured by VisiTec, has the largest chamber in the world at eight cubic meters and can examine specimens measuring up to 1-m in diameter by 1-m tall and weighing as much as 300-kg.  This microscope provides high resolution images at magnifications from 10x to 200,000x, while using a column that moves on a four-axis positioning system around the sample.  Now large components can be examined without cutting a small section for the conventional SEM.  

Not only can this new instrument examine the physical characteristics of large parts, it can also evaluate the chemical and crystalline properties of the material.  Unlike a conventional SEM that only have one or two associated analytical tools, the new LC-SEM is unique in that it has a variety of analytical tools designed for nondestructive evaluation.  The LC-SEM is equipped with backscattered electron imaging, energy dispersive x-ray spectrometry (EDS), electron backscatter diffraction (EBSD), and Fourier-transform infrared spectrometry (FT-IR).  The instrument’s variable-pressure mode adds yet another degree of freedom that enables engineers and scientists to perform critical surface characterization studies of both conductive and non-conductive samples, including metals, ceramics, and intermetallics. 

This LC-SEM is a one-stop examination and analytical tool for almost any sample, ranging in size from a grain of sand to a diesel engine.  A sample can be fully examined with only one instrument, without cutting the sample and introducing new anomalies to the microstructure.  The chamber is also large enough for in-situ experiments such as wear and compression studies.  The Y-12 National Security Complex is currently using a new large-chamber scanning electron microscope (LC-SEM) to analyze large and unique components of advanced materials.  The LC-SEM, manufactured by VisiTec, has the largest chamber in the world at eight cubic meters and can examine specimens measuring up to 1-m in diameter by 1-m tall and weighing as much as 300-kg.  This microscope provides high resolution images at magnifications from 10x to 200,000x, while using a column that moves on a four-axis positioning system around the sample.  Now large components can be examined without cutting a small section for the conventional SEM.
Not only can this new instrument examine the physical characteristics of large parts, it can also evaluate the chemical and crystalline properties of the material.  Unlike a conventional SEM that only have one or two associated analytical tools, the new LC-SEM is unique in that it has a variety of analytical tools designed for nondestructive evaluation.  The LC-SEM is equipped with backscattered electron imaging, energy dispersive x-ray spectrometry (EDS), electron backscatter diffraction (EBSD), and Fourier-transform infrared spectrometry (FT-IR).  The instrument’s variable-pressure mode adds yet another degree of freedom that enables engineers and scientists to perform critical surface characterization studies of both conductive and non-conductive samples, including metals, ceramics, and intermetallics. 

This LC-SEM is a one-stop examination and analytical tool for almost any sample, ranging in size from a grain of sand to a diesel engine.  A sample can be fully examined with only one instrument, without cutting the sample and introducing new anomalies to the microstructure.  The chamber is also large enough for in-situ experiments such as wear and compression studies.