G. A. Sargent, UES, Inc., Dayton, OH; T. T. Gorman, University of Dayton, Dayton, OH; A. Salem, A. L. Pilchak, Universal Technology Corporation, Wright-Patterson AFB, OH; M. G. Glavicic, Rolls-Royce Corporation, Indianapolis, IN; S. L. Semiatin, Air Force Research Laboratory, Wright-Patterson AFB, OH
Beta grain growth behavior and the evolution of transformed alpha-phase variants during beta annealing and subsequent slow cool-down of a Ti-6Al-4V ingot were determined using an electron- backscatter-diffraction (EBSD) technique. To this end the prior beta grains were deduced from room temperature alpha-phase data. The area fraction and location of individual alpha variants with respect to the beta grain boundaries were determined in both the as-cast and heat treated conditions. It was found that while repeated beta annealing and cooling had minor effect on the prior beta grain boundaries, it had a pronounced effect on the area fraction and the location of the alpha variants within each beta grain
