Wednesday, June 23, 2010: 1:30 PM
407 (Meydenbauer Center)
Beta grain growth behavior and the evolution of transformed alpha-phase variants during beta annealing and subsequent slow cool-down of a Ti-6Al-4V ingot were determined using an electron- backscatter-diffraction (EBSD) technique. To this end the prior beta grains were deduced from room temperature alpha-phase data. The area fraction and location of individual alpha variants with respect to the beta grain boundaries were determined in both the as-cast and heat treated conditions. It was found that while repeated beta annealing and cooling had minor effect on the prior beta grain boundaries, it had a pronounced effect on the area fraction and the location of the alpha variants within each beta grain
See more of: Session 5: Titanium Processing II
See more of: Titanium Alloys and Processing Technologies
See more of: Titanium Alloys and Processing Technologies