Additive3
Modeling and Design III

Tuesday, June 17, 2014: 8:00 AM-10:00 AM
Tallahassee 2 (Gaylord Palms Resort )
Session Chair:
Mr. Zach Loftus
8:00 AM
Real Time Defect Detection on New Generation Electron Beam Manufacturing System
Dr. Ryan Dehoff, Oak Ridge National Lab; Dr. Francisco Medina, Arcam; Mr. Ben George, Oak Ridge National Lab; Dr. Vincent C. Paquit, Oak Ridge National Lab; Ralph Dinwiddie, Oak Ridge National Lab
8:30 AM
Comparison of Microstructural Evolution in Ti-6Al-4V Multi-Layer Builds Produced By Three Additive Manufacturing Processes
Dr. Sri Lathabai, CSIRO; Dr. Matthew Glenn, CSIRO; Mr. Colin MacRae, CSIRO; Mr. David Ritchie, CSIRO
9:00 AM
Effect of Part Processing Temperature on Mechanical Properties in Electron Beam Melting
Mr. Jorge Mireles, University of Texas at El Paso; Dr. Sara M. Gaytan, University of Texas at El Paso; Mr. Hank Phelps, Lockheed-Martin; N/A David Espalin, University of Texas at El Paso; Dr. Ryan B. Wicker, University of Texas at El Paso
9:30 AM
Multi-sensing Process Monitoring and Control of Directed Energy AM Processes
Dr. James Craig, Stratonics, Inc.; Dr. Shawn M. Kelly, EWI; Dr. Ted Reutzel, Penn State Applied Research Lab; Dr. Richard Grylls, Optomec Company
10:00 AM
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