Residual Stress Measurement of Thin Specimen

Wednesday, March 15, 2023: 4:00 PM
201C (Fort Worth Convention Center)
Mrs. Mimi Nguyen-Vu , Pratt & Whitney, East Hartford, CT
Dr. Seung-Yub Lee , Pratt & Whitney, East Hartford, CT
Gabe Grodzicki , Proto Manufacturing, Taylor, MI
Dr. Adrian T. DeWald , Hill Engineering, LLC, Rancho Cordova, CA, Germany
Mr. Marko Barbul , Pratt & Whitney, East Hartford, CT
Ms. Ellie Taghaddos , Pratt & Whitney, East Hartford, CT
Residual stress measurement of thin specimens has been a challenge for both hole drilling and XRD techniques especially when the location of interest is close to the edge or geometric discontinuities. Not only geometric constraint, but data analysis can also be challenging due to the high stress gradient throughout the thickness. Goal of this presentation is to review the current methods and technical issues to establish best practices and validation methods for more accurate residual stress assessment on the thin specimens.