Mr. James Pineault

Proto Manufacturing
Taylor, MI
USA 48180

Papers:

RESIDUAL STRESS USING X-RAY DIFFRACTION TECHNIQUES – UNIFIED APPROACH
Session Keynote - Effects of Multi-Axis Oscillations – A Novel approach to Residual Stress Measurements via X-Ray Diffraction (30 minute presentation)
Inter-Method Comparisons of Residual Stress Measurement Data
Case Studies of In-Situ Residual Stress Measurements on Bridges and Structures