Mr. James Pineault

Proto Manufacturing
Taylor, MI
USA 48180

Papers:

RESIDUAL STRESS USING X-RAY DIFFRACTION TECHNIQUES – UNIFIED APPROACH
Effects of Multi-Axis Oscillations in Residual Stress Measurements via X-Ray Diffraction
Inter-Method Comparisons of Residual Stress Measurement Data
Case Studies of In-Situ Residual Stress Measurements on Bridges and Structures