Monday, October 20, 2025: 1:30 PM-2:50 PM
1:50 PM
Advanced Metrology Suite to Link Residual Stress and Fundamental Properties in Semiconductor Packaging Polymers
Dr. Stian Romberg, National Institute of Standards and Technology;
Dr. Polette Centellas, National Institute of Standards and Technology;
Dr. Ran Tao, National Institute of Standards and Technology;
Dr. Alexander Landauer, National Institute of Standards and Technology;
Dr. Eric Schoch, Northrop Grumman;
Dr. Huong Giang Nguyen, National Institute of Standards and Technology;
Dr. Gale Holmes, National Institute of Standards and Technology;
Dr. Gery Stafford, National Institute of Standards and Technology;
Dr. Amanda Forster, National Institute of Standards and Technology;
Dr. Christopher Soles, National Institute of Standards and Technology