Residual Stress Measurement Methods I

Monday, October 20, 2025: 9:00 AM-10:20 AM
140B (Huntington Place Convention Center)
Dr. E. Andrew Payzant, Oak Ridge National Laboratory
9:00 AM
Introductory Remarks
9:10 AM
Session Keynote - Effects of Multi-Axis Oscillations – A Novel approach to Residual Stress Measurements via X-Ray Diffraction (30 minute presentation)
Mr. James Pineault, Proto Manufacturing
9:40 AM
RESIDUAL STRESS IN HETEROGENOUS – TWO-PHASE MATERIALS
Dr. Mohammed Belassel, Proto Manufacturing
10:00 AM
XRD analysis of out-of-plane shear stresses by 2D-detectors
Dr. Jan Schubnell, Fraunhofer Institute for Mechanics of Materials; Mr. Ardeshir Sarmast, University of Freiburg; Dr. Eva-Regine Carl, Fraunhofer Institute for Mechanics of Materials; Dr. Johannes Preußner, Fraunhofer Institute for Mechanics of Materials; Dr. Manuel Hinterstein, Fraunhofer Institute for Mechanics of Materials
See more of: Technical Program
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