Residual Stress Measurement Methods III

Monday, October 20, 2025: 1:30 PM-3:10 PM
1:30 PM
Current Residual Stress Diffractometer at the High Flux Isotope Reactor (HIDRA) and Proposed Upcoming Upgrades
Dr. Jeff Bunn, Oak Ridge National Laboratory; Dr. Chris Fancher, Oak Ridge National Laboratory; Mr. Ray Gregory, Oak Ridge National Laboratory; Mr. Doug Kyle, Oak Ridge National Laboratory; Dr. E. Andrew Payzant, Oak Ridge National Laboratory
1:50 PM
Synchrotron x-ray methods for evaluation of residual stress
Dr. Christopher Budrow, Budrow Consulting LLC; Dr. Kelly Nygren, Cornell High Energy Synchrotron Source; Dr. Jun-Sang Park, Argonne National Laboratory; Dr. Mark Obstalecki, Air Force Research Laboratory; Dr. Paul Shade, Air Force Research Laboratory
2:10 PM
Mapping bulk triaxial residual stress fields by combination of synchrotron x-ray diffraction and contour method measurements
Dr. Nicholas A. Bachus, University of California; Dr. Donald W. Brown, Los Alamos National Laboratory; Dr. Bjørn Clausen, Los Alamos National Laboratory; Dr. Christopher R. D'Elia, Level Engineering, Inc.; Prof. Michael R. Hill, University of California, Davis
2:30 PM
RESIDUAL STRESS USING X-RAY DIFFRACTION TECHNIQUES – UNIFIED APPROACH
Dr. Mohammed Belassel, Proto Manufacturing; Mr. James Pineault, Proto Manufacturing; Mr. Michael Brauss, Proto Manufacturing
2:50 PM
Investigation of residual stresses in a longitudinal gusset joint using welding simulation and qualitative Barkhausen Noise analysis
Mr. J.T. Riski, LUT University; Mr. T. Pesonen, LUT University; Dr. A. Ahola, LUT University; Prof. T. Skriko, LUT University; Prof. T. Björk, LUT University
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