Characterization of Materials and Microstructure through Metallography, Image Analysis, and Mechanical Testing - Fundamental and Applied Studies

Tuesday, October 27, 2020: 12:00 PM-2:00 PM
Dr. Donald Susan, Sandia National Laboratories
12:00 PM
Microstructural characterization and analysis using computer vision and machine learning
Prof. Elizabeth A. Holm, PhD FASM FTMS, Carnegie Mellon University
12:40 PM
Selective area polishing with depth resolution using a Dimpler
Mr. Jake R. Jokisaari, PhD, Ted Pella, Inc.
1:00 PM
Study of the variation in microstructure, texture and mechanical properties of additive manufactured Ti-6Al-4V builds
Ms. Meiyue Shao, The Ohio State University; Sriram Vijayan, the Ohio State University; Evan Hass, the Ohio State University; Kayla Hepler, the Ohio State University; Prof. Joerg Jinschek, PhD, The Ohio State University
1:40 PM
Classification of bainitic microstructures with machine learning – how to assign the ground truth in the most objective way
Mr. Martin Mueller, Material Engineering Center Saarland, Saarland University; Dr. Dominik Britz, Material Engineering Center Saarland, Saarland University; Dr. Thorsten Staudt, AG der Dillinger Hüttenwerke; Prof. Frank Muecklich, Material Engineering Center Saarland, Saarland University
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