Yield Basics for Failure Analysts

Wednesday, September 15, 2021: 9:40 AM
224 (America's Center)
Mr. David Albert , IBM (Retired), Hopewell Junction, NY

Provide an overview of Terminology and Basic Concepts of:

  • Semiconductor Yield Analysis
  • Yield Modeling
  • Yield Improvement Methodologies

Provide case studies highlighting Recommended Practices that provide optimized feedback to enable Yield Improvement

See more of: ISTFA Tutorials I
See more of: ISTFA Tutorials