Advanced electron microscopy (SEM) techniques for fractography.

The use of scanning electron microscopy (SEM) in the assessment of fracture surfaces is well established. The intent of the current presentation is to assess the use of wide area mapping together with advances in image analysis and machine learning. These advances could aid the assessment of crack surface features. Semi-automated assessment of fatigue crack growth rates (FCGR) from fracture surfaces for example. The current state of the art will be examined including commercially available software. Promising areas for future development will also be discussed.