The Sorby Award 50 Years of Excellence I

Monday, October 20, 2025: 3:00 PM-5:20 PM
320 (Huntington Place)
3:00 PM
Snapshots from a Career of Metallography and Failure Analysis: Wisdom to Share from a Diversity of Experience
Chris Bagnall, Retired - MCS Associates, Inc.
3:20 PM
The Critical Role of Advanced Microstructural Characterization in Understanding and Modeling Materials Performance in Challenging Environments
Dr. Mary Grace Burke, Idaho National Laboratory
3:40 PM
Are Dislocations Unimportant Now?
Dr. C Barry Carter, University of Connecticut
4:00 PM
New Surfaces, - ‘Without’ Chemistry? Bioinspired Microtopographic Material Surfaces – and also, Why We Sent Them into Space
Frank Mucklich, Universität des Saarlandes
4:20 PM
Next generation 2D semiconductor materials and devices beyond silicon
Colin Humphreys, Queen Mary University of London
See more of: (IMS) Characterization of Materials and Microstructure through Metallography, Image Analysis, and Mechanical Testing - Fundamental and Applied Studies
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