Reports by Hung-Sung Lin

	A study of photoelectric effect caused by laser beam used for beam bounce technique in a C-AFM system
	Applications of C-AFM and CBED techniques to the characterization of substrate dislocations causing SRAM soft single column failure contained in a wafer with (001) plane/[100] notch
	Applications of Nanoprober Technique to the characterization of mismatched behavior in advanced SRAM devices