B. Holdford
Texas Instruments
Dallas, TX
Packaging
 

C. Richardson
Abound Solar
Fort Collins, CO
FIB
Fault Isolation
 

C. Furlong
Worcester Polytechnic Institute, WPI
Worcester, MA
Fault Isolation
FA Basics
 

J. Griffin
Analog Devices
Norwood, MA
Analog Device Failure Analysis
 

J. A. Walraven
Sandia National Labs
Albuquerque, NM
Microscopy Tools
MEMS Devices
 

K. S. Wills
Independent Consultant
Sugar Land, TX
Yield, Test and Diagnostics
FA Basics
Packaging
Yield
 

L. G. Henry
ESD-TLP Consulting & Testing
Fremont,, CA
Failure Mechanisms
EOS/ESD
 

R. Ring
SMSC Austin
Austin, TX
Emerging Technologies
Device and Memory FA
 

S. Subramanian
Freescale Semiconductor, Inc.
Austin, TX
Materials Characterization
 

S. Li
Spansion Inc
Sunnyvale, CA
Device and Memory FA
 

T. Myers
ON Semiconductor
Gresham, OR
Yield, Test and Diagnostics
 

Z. Wang
Intel Corporation
Chandler, AZ
Lead Free Packaging
Packaging
Lab Management