M. A. Sienkiewicz, CNES (French Space Agency) (& Freescale Semiconductor), Toulouse, France; S. Brule, O. Crepel, Freescale Semiconductor SAS, Toulouse, France; A. Firiti, Freescale Semiconductor, Toulouse, France

Summary: Soft Defect localization laser techniques in dynamically working semiconductor devices are widely used for Failure Analysis (FA). In this context, many AC signal-oriented analysis methods have been introduced to date (SDL, LADA…) or are under development (xVM…). Sophisticated tools are available to localize these kind of failures but they are expensive and not every FA laboratory can afford them. By fully exploiting the capabilities of static localization tools it is possible to deal with timing issues. In this abstract, we propose a novel application of the OBIRCh amplifier related to the timing issues on a real case study (Mixed-Mode device). This novel and very simple application makes the analysis flow time-attractive and enlarges the application field of mapping techniques on the existing tools.