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| Session 8: Scanned Probe Microscopy | ||||
| Location: Portland Ballroom 254 (Oregon Convention Center ) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chairs: | Mr. Phil Kaszuba IBM Microelectronics, Essex Junction, VT Mr. Terence Kane IBM, Hopewell Junction, NY | |||
| 9:50 AM | Nano CV Probe Characterization Analysis Comparison with Conventional CV Probe Pad Analysis | |||
| 10:15 AM | Analysis of Deep Trench Node Leakage Depth by applying Current Imaging Technique at Silicon Level | |||
| 10:40 AM | Networking Lunch | |||