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| Failure Mechanisms | ||||
| Location: Meeting Room E141 (Oregon Convention Center ) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chair: | Dr. Leo G. Henry ESD-TLP Consulting & Testing, Fremont,, CA | |||
| 5:15 PM | Case Studies of Localized Degradation Phenomena in Copper Interconnects during Electromigration Testing | |||