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Sunday, November 14, 2010 - 1:00 PM

Yield Basics for Failure Analysts

D. Albert, IBM, Hopewell Junction, NY; T. Myers, ON Semiconductor, Gresham, OR

Provide an overview of terminology and basic concepts of semiconductor yield analysis, yield modeling, and yield improvement methodologies.

Provide case studies highlighting recommended practices that provide optimized feedback to enable yield improvement.