Everything DFT testing in 90 minutes covers key principles and most important topics relevant to scan based testing of random logic. We start with the product design cycle, cover general test methods, and then dig deeper into defects and faults, touching the workings of test and diagnosis software. Selected topics regarding test are embedded, on-chip compression, and, based on last year's feedback, new in 2010, also logic built-in self-test (BIST), low-power ATPG, and timing-aware ATPG.

After completion of this tutorial, the attendee will have a good, general understating of test, and key principles and methodologies of scan based testing of logic. The attendee will be able to follow any test related presentation at ISTFA and understand test related articles.