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| FIB | ||||
| Location: Lalique II (InterContinental Hotel Dallas) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: Within the last two decades, the focused ion beam machine has become a jack-of-all-trades in the failure analysis lab. The FIB Track is dedicated to the multiple uses of this tool. | ||||
| Session Chair: | Mr. Kultaransingh (Bobby) Hooghan FEI KAUST, Saudi Arabia | |||
| 2:15 PM | Focused Ion Beam - A Sample Preparation Tool | |||
| 3:00 PM | Refreshment Break | |||
| 3:15 PM | Focused Ion Beam (FIB) - A Design Repair / Fault Isolation Tool | |||