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| Fault Isolation | ||||
| Location: Malachite Showroom (InterContinental Hotel Dallas) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: The haystacks are taller, and the needles are smaller. Before any understanding of a root cause can start, the failure analyst must first find the location of the defect on a failing chip. The Fault Localization Track focuses on both imaging and software techniques that can pinpoint a defective location on the failing chip. | ||||
| Session Chairs: | Ms. Susan Li Spansion Inc, Sunnyvale, CA Mr. Randal E. Mulder Silicon Labs, Austin, TX | |||
| 8:00 AM | Fundamentals of Laser-Based FA Techniques | |||
| 9:15 AM | Lada and SDL Techniques | |||
| 10:15 AM | Refreshment Break | |||
| 10:30 AM | A Practical Guide to Using Scan Diagnosis for Failure Analysis | |||
| 12:00 PM | Lunch | |||
| 1:00 PM | Magnetic Based Current Imaging for Fault Isolation in Die and Packages | |||