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Technology-Specific Failure Analysis
Location: Lalique I (InterContinental Hotel Dallas)
(Please check final room assignments on-site).
Session Description: Failure analysts share a common toolset and common techniques. Some individual technologies, however, have developed techniques that take advantage of the unique structure or materials of the technology. In the Technology-Specific FA track, we discuss the failure analysis of memories, micro-electromechanical systems (MEMS), analog circuits, and certain process technologies.
Session Chairs:	Mr. Dan J. Bodoh Freescale Semiconductor, Austin, TX Dr. Sam Subramanian Freescale Semiconductor, Inc., Austin, TX
8:00 AM			Emerging Trends in Failure Modes of Nanotechnology
9:15 AM			Diagnosing Analog Circuit Failures
10:15 AM			Refreshment Break
10:30 AM			Introduction to MEMS: Materials and Fabrication Processes