P. C. Ing Habil Olaru, IMA-METAV-Research Aircraft Centre, Bucharest, Romania; D. Hui, Univ.of New Orleans, New Orleans, LA
Recently .Electron Beckscatter Diffraction -EBSD and Orientation Imaging Microscopy - OIM, have been shown to be useful in investigating the properties of thin materials samples of Al-Ni eutectic directional solidification of varying microstructures. Keywords: SEM, EBSD, OIM, Eutectic, Solidification.
Summary: Abstract:
Recently .Electron Beckscatter Diffraction -EBSD and Orientation Imaging Microscopy - OIM, have been shown to be useful in investigating the properties of thin materials samples of Al-Ni eutectic directional solidification of varying microstructures.
Keywords:
SEM, EBSD, OIM, Eutectic, Solidification.
