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Monday, August 1, 2005 - 10:00 AM
SES .3
TEM characterization of thin passive films grown on austenitic stainless steels
R. S. Yassar, A. Alamr, M. G. Norton, D. F. Bahr, D. P. Field, Washington State University, Pullman, WA
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Summary:
In this work transmission electron microscopy and electron diffraction were used to characterize the influence of alloy chemistry on the structure of thin films grown on three different types of stainless steel 904L, 316 and 304.
