Nonmetallic inclusions and other secondary-phase constituents are important factors in the service performance of components fabricated from nickel-titanium alloys, including their resistance to fatigue fracture and corrosion. The traditional method for characterizing inclusions in Nitinol is light microscopy examination of metallographically-prepared specimens. Light microscopy, however, has limitations for minimum detectable feature size and is not sensitive to detection of some phases commonly found in Nitinol microstructures. Scanning electron microscopy (SEM) using backscattered electron imaging (BEI) has been shown to be a superior technique for detecting and analyzing secondary phase features in Nitinol. The accurate characterization of smaller secondary-phase features in Nitinol that is possible by SEM has become critical due to the increased use of this alloy in very small components, such those fabricated from fine wires, thin-wall tubes, and thin sheets for applications in medical devices. Computer-controlled SEM image capture and improved image analysis possible with the superior contrast in the BEI images readily provide the accurate characterization of Nitinol needed for quality assurance for critical components.