In Situ Characterization of Optical Films during Deposition.

Characterization of thin films and the analysis of optical properties is a common process for the optical coating professional.  Monitoring and control of thin films by optical and mechanical methods is also a common practice and somewhat well understood.  This paper will discuss the results of a single experiment monitoring the deposition of SiO2 on BK7 calling a specific end of layer condition.  We all know to some extent the effect of venting on a coating.  This experiment will in situ monitor the change in coating during the vent cycle describing the thickness and optical property change in the coating.  This paper will discuss the method and results the coating evaluation.