Comparison of Three Different Ion Sources and the Effects of Additional Neutralizer Current

Monday, May 1, 2017: 11:40 AM
Ballroom BC (Rhode Island Convention Center)
Ronald Willey , Willey Optical, Consultants, Charlevoix, MI
R. Shakoury , Department of Physics, Imam Khomeini International University, Qazvin, Iran (Islamic Republic of)
Wayne G Sainty , Saintech Ion Beam Systems, Gladesville, NSW, Australia
Ketan Patel , Luma Optics Pvt Ltd,, Mumbai, India
The behaviors of three significantly different geometries of industrial ion sources are compared.   The gas flow needed for a given discharge voltage can be significantly reduced by additional neutralizer filament current beyond that needed to eliminate arcing/sparking due to excess charge build-up from the positive ions from the source.  This reduced gas flow also reduces the process pressure and thereby reduces the competition of that gas for a position in the matrix of a film being deposited with the ion assisted deposition intended to produce increased film density.
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