Deposition of Carbonaceous Siloxane Films via Atmospheric Pressure PECVD
Deposition of Carbonaceous Siloxane Films via Atmospheric Pressure PECVD
Tuesday, May 2, 2017
Transparent SiO2 coatings have been used in applications ranging from microelectronics, optical applications, antireflection coatings, and as barrier layers or hard coatings on polymer substrates. In this study, the investigators explore a newly developed afterglow type atmospheric plasma system that enables the treatment of conductive surfaces and the co-deposition of metallic nano-particulates in the AP-PECVD film. Organosiloxane precursors (HMDSO and TMCTS) are mixed with Au nano-rods and AP-PECVD coatings are attempted on both silicon wafers and ultra-high molecular weight polyethylene (UHMWPE). It was desirable to gain an understanding of what effects AP-PECVD parameters (substrate material, precursor type and plasma power) had on the properties of the resulting SiO2 film. Additionally, three precursor delivery methods (bubbler, nebulizer, and aerosol) were used in order to co-deposit nanoparticles within the SiO2 coating. Scanning electron microscopy (SEM), X-Ray photoelectron spectroscopy (XPS), and Rutherford backscattering spectroscopy (RBS) were used to characterize the coatings. From analysis it was determined that the carbon content within the SiO2 is greatly dependent on the plasma power and precursor flow rate, allowing the deposition of gradient coatings that vary from polymeric (~18% C) to wear-resistant (~4% C). SiO2 nanoparticles were successfully co-deposited with the SiO2 films.