In-situ experiments involving scanning electron microscopy (SEM) are generally developed at room or intermediate  temperatures; but only few experiences are performed above 1000°C for many reasons as: decreasing signal-to-noise ratio due to the thermal emission of electrons and photons from the sample; compromised image resolution due to the usual large work distance used to avoid the damage of detectors and polar piece; possible decomposition of sample and gas evolution with subsequent pressure increase; and the necessary modifications to the microscope and vacuum chamber to accommodate the necessary devices and detectors. In addition to the difficulties associated to high temperature, the straining experiments bring some new challenges as: limited space within the SEM chamber; specimen geometry design to allow the observation of straining and fracture at the right location; reproduction of strain rate representative of the process to be studied; keep tracking at high magnifications of specific locations at the sample surface during the whole straining test; and the vacuum and magnetic field compatibility of the equipments. Thus, when all these challenges are put together as in the proposed high temperature (1200 °C) straining experiment, the result is a complex test that should be performed under extremely controlled conditions to avoid damaging the involved equipments. However, the results that can be obtained with such ambitious experiments are valuable and very difficult to obtain through indirect observation of the phenomena. This in-situ testing capabilities are being used along with digital image correlation algorithms for strain mapping at the micro scale to study the fundamental aspects of the ductility-dip cracking phenomena of Ni-base alloys FM52 and FM82 in order to better understand the phenomena and allow the development of DDC resistant alloys.