Failure Analysis of Aerospace Components

Wednesday, April 12, 2017: 8:30 AM-10:00 AM
Room 8 (Charleston Area Convention Center)
Dr. Rajiv Soman, EAG Laboratories
8:30 AM
Field Guide of Failure Mechanisms in Electronics
Mr. Steven J. Chun, Boeing Space and Intelligence Systems; Dr. Stella Kim, Boeing Space and Intelligence Systems; Ms. Seraina Murphy, Boeing Space and Intelligence Systems; Mr. Joseph O'Day, The Boeing Company; Dr. Anduin touw, Boeing Space and Intelligence Systems; Dr. Don helling, Boeing Space and Intelligence Systems
9:00 AM
Fractography and Material Characterization of Additively Manufactured Ti-6Al-4V
Ms. Devon Beckett, Naval Air Systems Command
9:30 AM
Life Extension of Life Limited Jet Engine Components Using a Large Chamber Scanning Electron Microscope
Mr. Rodolfo (Rudy) Villa, Tinker AFB
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