S. Rohde, D. M. Mihut, J. A. Turner, University of Nebraska - Lincoln, Lincoln, NE; S. M. Aouadi, Southern Illinios University - Carbondale, Carbondale, IL
Metal-BN (M-BN) thin films a currently being explored by several research teams, because their unique properties may provide a means of producing tailored reduced-friction, high-wear surfaces by combining the excellent wear and corrosion resistance of transition metal nitrides (CrN, TiAlN, TiN, …) with the low friction behavior of hexagonal-BN and/or amorphous-BN. The aim of the present study was to characterize the nanomechanical properties of several M-BN nanocomposite thin films including, CrBN and TiBN. These nanocomposites were produced using reactive, physical vapor deposition (PVD) to generate a wide range of film chemistries and controlled nanoscale microstructures. The nanomechanical properties of thin films were characterized using: atomic force microscope (AFM) in conjunction with Hysitron Triboscope. Microwear measurements were carried out using positive constant normal loads, the wear tracks were imaged, and these images processed using the ProScan Image Processing software. Reported are some the first time friction coefficients, surface roughnesses, and microwear studies of these M-BN materials. Chemical compositions of deposited thin films are investigated using Auger electron spectroscopy (AES), X-Ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) and these data are correlated with the nanomechanical properties of these M-BN thin films. The properties of these films varied strongly with film chemistry and deposition parameters. In some cases, yielding nanohardesses as high as 40 GPa and rms surface roughness of less than 1nm.
Summary: Metal-BN (M-BN) films combine the wear and corrosion resistance of CrN, TiAlN, TiN, etc … with the low friction behavior of hexagonal-BN and/or amorphous-BN. Sputtered CrBN and TiBN films were characterized using nanoindentation (H>40 GPa) and microwear (roughness < 1nm rms) measurements and correlated with AES, XPS and XRD results.