Residual Stress Determination in Surface Layers of Martensitic Stainless Steel Freeflex® Versa using Grazing-Incidence X-ray Diffraction
In this work, residual stresses of Freeflex® Versa have been investigated using X-ray diffraction (XRD). For obtaining an average of macroscopic stresses, the conventional single-reflection XRD was used. To study the macroscopic stress gradient profile of the outermost surface layers, multi-reflection Grazing Incidence XRD (GIXRD) technique has been employed. The investigated material samples were in as produced and tumbled conditions. The results indicate a significant level of compressive stresses in the vicinity of the surface (~1- 2 µm) due to the tumbling process. The residual stresses measured by single reflection were found to be lower compared to the GIXRD residual stresses, indicating that conventional residual stress measurements provide data from a material depth not fully affected by the tumbling process.