Residual Stress Measurement Methods II

Monday, October 20, 2025: 10:40 AM-12:00 PM
140B (Huntington Place Convention Center)
10:40 AM
SI-traceability of XRD residual stress data by using Fe Kα radiation
Dr. Sebastian Send, Stresstech GmbH; Mr. Jonathan Mohan, Stresstech Inc.; Dr. Mikko Palosaari, Stresstech Oy
11:00 AM
Residual Stress Determination in Surface Layers of Martensitic Stainless Steel Freeflex® Versa using Grazing-Incidence X-ray Diffraction
Ms. Rebecka Damgren, Alleima EMEA AB; Dr. Anders Hoel, Alleima Striptech AB; Dr. Nazanin Hosseini, Alleima EMEA AB
11:20 AM
Session Keynote - Development of Smart Test Plans by Linking Modeling and Physical Testing (40 minute presentation)
Dr. Iuliana Cernatescu, Pratt & Whitney Division of Raytheon Technologies Corporation; Dr. Vasisht Venkatesh, Pratt & Whitney Division of Raytheon Technologies Corporation
See more of: Technical Program
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