Residual Stress Measurement Methods II

Monday, October 20, 2025: 10:40 AM-12:00 PM
10:40 AM
A Study on Minimizing Measurement Time Based on Active Experimentation for Energy dispersive X-Ray Diffraction
Dr. Alexander Liehr, University of Kassel; Ms. Kristina Dingel, University of Kassel; Dr. Daniel Kottke, University of Kassel; Mr. Sebastian Degener, Bundesanstalt für Materialforschung- und prüfung; Prof. Bernhard Sick, University of Kassel; Prof. Thomas Niendorf, University of Kassel
11:00 AM
SI-traceability of XRD residual stress data by using Fe Kα radiation
Dr. Sebastian Send, Stresstech GmbH; Mr. Jonathan Mohan, Stresstech Inc.; Dr. Mikko Palosaari, Stresstech Oy
11:20 AM
Depth-resolved stress measurement by x-ray powder diffraction tomography
Prof. Peter Modregger, Universität Siegen
11:40 AM
Residual Stress Determination in Surface Layers of Martensitic Stainless Steel Freeflex® Versa using Grazing-Incidence X-ray Diffraction
Ms. Rebecka Damgren, Alleima EMEA AB; Dr. Anders Hoel, Alleima Striptech AB; Dr. Nazanin Hosseini, Alleima EMEA AB
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