Residual Stress Measurements Using X-Ray Diffraction Techniques
Residual Stress Measurements Using X-Ray Diffraction Techniques
Monday, September 30, 2024: 1:00 PM
25 B (Huntington Convention Center)
This presentation provides an overview of the state-of-the-art and the-art-of-the-possible for residual stress measurements using x-ray diffraction techniques.
See more of: Tutorial Session: Residual Stress Characterization Using Scattering Techniques
See more of: Residual Stress
See more of: Residual Stress