Tutorial Session: Residual Stress Characterization Using Scattering Techniques

Monday, September 30, 2024: 1:00 PM-2:30 PM
25 B (Huntington Convention Center)
1:00 PM
Residual Stress Measurements Using X-Ray Diffraction Techniques
Mr. James Pineault, Proto Manufacturing
1:40 PM
Utilization of Neutrons for Residual Stress Characterization
Dr. Jeff Bunn, Oak Ridge National Laboratory
See more of: Residual Stress
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