B. Holdford
Texas Instruments
Dallas, TX
Device and Test 2
Device and Test 3
Packaging 1
Packaging 2
|
B. Waterson
Analog Devices
Cambridge, MA
Device and Test 1
|
C. Richardson
Abound Solar
Fort Collins, CO
Yield
Microscopy Tools 2
|
C. Furlong
Worcester Polytechnic Institute, WPI
Worcester, MA
Sample Preparation
|
J. A. Walraven
Sandia National Labs
Albuquerque, NM
MEMS
|
J. Hudson
University of Oregon
Eugene, OR
Microscopy Tools 1
Microscopy Tools 2
Fault Isolation 2
|
K. S. Wills
Independent Consultant
Sugar Land, TX
Packaging 1
Sample Preparation
|
L. G. Henry
ESD-TLP Consulting & Testing
Fremont,, CA
Failure Mechanisms
|
R. Ring
SMSC Austin
Austin, TX
Device and Test 3
Fault Isolation 1
Yield
|
T. Myers
ON Semiconductor
Gresham, OR
Failure Analysis Management
|
W. Vanderlinde
Laboratory for Physical Sciences
College Park, MD
Tutorial
Device and Test 1
Fault Isolation 1
Failure Mechanisms
|
