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Sunday, November 14, 2004 | ||
8:00 AM-12:15 PM | ||
Device and Test 1 | ||
8:15 AM-12:15 PM | ||
Microscopy Tools 1 | ||
Packaging 1 | ||
12:15 PM-6:30 PM | ||
Device and Test 2 | ||
Microscopy Tools 2 | ||
Yield | ||
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Monday, November 15, 2004 | ||
8:00 AM-12:15 PM | ||
Fault Isolation 1 | ||
MEMS | ||
Packaging 2 | ||
12:15 PM-2:30 PM | ||
Fault Isolation 2 | ||
12:15 PM-3:45 PM | ||
Sample Preparation | ||
12:15 PM-6:00 PM | ||
Device and Test 3 | ||
2:30 PM-5:45 PM | ||
Failure Mechanisms | ||
3:45 PM-5:45 PM | ||
Failure Analysis Management |