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Wednesday, November 17, 2004 - 8:50 AM
28.2

Single Cell Failures Caused By A Lateral Gate Effect

M. Versen, University of Applied Sciences Rosenheim, Rosenheim, Germany; A. Schramm, Qimonda AG, Neubiberg, Germany; P. Beer, J. Lindolf, Infineon Technologies AG, Munich, Germany

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