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Symposium

Tuesday, November 16, 2004
8:45 AM-9:10 AM
Session 1: Nanotechnology
9:10 AM-11:10 AM
Session 2: Advanced Techniques
11:10 AM-1:30 PM
Session 3: SPM Techniques 1
Session 4: Test 1
1:30 PM-3:55 PM
Session 5: Package Level Analysis 1
Session 6: Die Level Fault Isolation
3:55 PM-5:40 PM
Session 7: Failure Analysis Process 1
Session 8: Circuit Edit for FA, FI and Debug 1
Wednesday, November 17, 2004
8:00 AM-9:35 AM
Session 10: Optical Techniques 1
Session 9: Test 2
9:35 AM-1:45 PM
Session 11: Panel Discussion
Session 12: MEMS
11:40 AM-1:45 PM
Poster
1:45 PM-4:10 PM
Session 13: Metrology and Materials Analysis 1
Session 14: System Level Analysis 1
4:10 PM-5:50 PM
Session 15: Optoelectronic Devices
Session 16: Sample Preparation 1
Thursday, November 18, 2004
8:00 AM-10:25 AM
Session 17: SPM Techniques 2
Session 18: Package Level Analysis 2
Session 19: Yield Enhancement
10:25 AM-12:40 PM
Session 20: Metrology and Materials Analysis 2
Session 21: System Level Analysis 2
Session 22: Optical Techniques 2
12:40 PM-3:05 PM
Session 23: Metrology and Materials Analysis 3
Session 24: SPM Techniques 3
Session 25: Failure Analysis Process 2
3:05 PM-4:45 PM
Session 28: Test 3
3:05 PM-5:00 PM
Session 26: Circuit Edit for FA, FI and Debug 2
Session 27: Sample Preparation 2