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| Session 10: Optical Techniques 1 | ||||
| Location: South Ballroom (Worcester's Centrum Centre) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: Optical techniques have expanded in recent years to cover a range of capabilities from locating hard failures to waveform extraction. The constant evolution of IC technology to smaller feature size and new materials places constant stress on the limits of optical techniques. Waveform extraction, photoemission of 90nm nodes and high resolution subsurface thermal imaging are presented. | ||||
| Editors: | Mr. Ted Hasegawa National Semiconductor, Santa Clara, CA Felix Beaudoin IBM Mr. Michael Eskenazi Qualcomm Corporation, San Diego, CA Mr. Stanley Swieck Analog Devices, Wilmington, MA James Cargo Agere Systems, Allentown, PA Mr. David Vallett IBM Systems and Technology Group, Essex Jct., VT Mr. Jim Colvin FA Instruments, San Jose, CA | |||
| Session Chairs: | Mr. Jim Colvin FA Instruments, San Jose, CA Dr. Aaron Falk OptoMetrix, Inc, Renton, WA | |||
| 8:00 AM | 10.1 | PLENARY TALK: Timing Analysis of a Microprocessor PLL using High Quantum Efficiency Superconducting Single Photon Detector (SSPD) | ||
| 8:25 AM | 10.2 | Analysis of 0.13 CMOS Technology Using Time Resolved Light Emission | ||
| 8:50 AM | 10.3 | Photon Emission Microscopy in 90 nm CMOS Technologies | ||
| 9:15 AM | Break | |||