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Fault Isolation 1 | ||||
Location: South Ballroom (Worcester's Centrum Centre) | ||||
(Please check final room assignments on-site). | ||||
Session Description: | ||||
Editors: | Mr. David Vallett IBM Systems and Technology Group, Essex Jct., VT Dr. William Vanderlinde Laboratory for Physical Sciences, College Park, MD | |||
Session Chairs: | Dr. William Vanderlinde Laboratory for Physical Sciences, College Park, MD Rose Ring SMSC Austin, Austin, TX | |||
8:00 AM | Beam-Based Defect Localization Techniques | |||
10:00 AM | Break | |||
10:15 AM | Magnetic based Current Imaging for Fault Isolation in Die and Packages | |||
11:15 AM | Flip-Chip and Backside Techniques |