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| Fault Isolation 1 | ||||
| Location: South Ballroom (Worcester's Centrum Centre) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Editors: | Mr. David Vallett IBM Systems and Technology Group, Essex Jct., VT Dr. William Vanderlinde Laboratory for Physical Sciences, College Park, MD | |||
| Session Chairs: | Dr. William Vanderlinde Laboratory for Physical Sciences, College Park, MD Rose Ring SMSC Austin, Austin, TX | |||
| 8:00 AM | Beam-Based Defect Localization Techniques | |||
| 10:00 AM | Break | |||
| 10:15 AM | Magnetic based Current Imaging for Fault Isolation in Die and Packages | |||
| 11:15 AM | Flip-Chip and Backside Techniques | |||