|
Back to "Tutorial" Search | Back to Main Search | |||
Failure Mechanisms | ||||
Location: South Ballroom (Worcester's Centrum Centre) | ||||
(Please check final room assignments on-site). | ||||
Session Description: | ||||
Editors: | Mr. David Vallett IBM Systems and Technology Group, Essex Jct., VT Dr. William Vanderlinde Laboratory for Physical Sciences, College Park, MD | |||
Session Chairs: | Dr. William Vanderlinde Laboratory for Physical Sciences, College Park, MD Dr. Leo G. Henry ESD-TLP Consulting & Testing, Fremont,, CA | |||
2:30 PM | Physics of Failure - The Good Part about Bad Parts | |||
3:30 PM | Break | |||
3:45 PM | Electromigration in Copper Interconnects - Failure Analysis and Degradation Studies |