B. Holdford
Texas Instruments
Dallas, TX
Packaging 1
Packaging 2
 

C. Rue
FEI Company
Hillsboro, OR
Yield
Fault Isolation 2
 

C. Richardson
Abound Solar
Fort Collins, CO
Microscopy Tools 2
Microscopy Tools 3
 

C. Furlong
Worcester Polytechnic Institute, WPI
Worcester, MA
Microscopy Tools 3
 

J. Arnold
ASM International
Materials Park, OH
Prize Drawing
 

J. A. Walraven
Sandia National Labs
Albuquerque, NM
MEMS
 

K. S. Wills
Independent Consultant
Sugar Land, TX
Failure Analysis Basics
Packaging 1
Sample Preparation
 

L. G. Henry
ESD-TLP Consulting & Testing
Fremont,, CA
Failure Mechanisms
 

R. Ring
SMSC Austin
Austin, TX
Device and Test 1
Fault Isolation 1
 

S. Subramanian
Freescale Semiconductor, Inc.
Austin, TX
Microscopy Tools 1
Microscopy Tools 2
Microscopy Tools 3
 

S. Li
Spansion Inc
Sunnyvale, CA
Device and Test 1
Device and Test 2
 

T. Myers
ON Semiconductor
Gresham, OR
Failure Analysis Laboratory Management
 

V. Chowdhury
Altera Corp.
San Jose, CA
Device and Test 3
 

W. Vanderlinde
Laboratory for Physical Sciences
College Park, MD
Monte Carlo software tools for energy dispersive x-ray analysis
Introduction
Prize Drawing