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| Sunday, November 6, 2005 | ||
| 8:00 AM-8:10 AM | ||
| Introduction | ||
| 8:15 AM-10:30 AM | ||
| Failure Analysis Basics | ||
| 8:15 AM-12:00 PM | ||
| Device and Test 1 | ||
| Packaging 1 | ||
| 10:30 AM-12:00 PM | ||
| Microscopy Tools 1 | ||
| 1:00 PM-3:30 PM | ||
| Yield | ||
| 1:00 PM-6:30 PM | ||
| Device and Test 2 | ||
| Microscopy Tools 2 | ||
| 3:30 PM-6:30 PM | ||
| Sample Preparation | ||
|   | ||
| Monday, November 7, 2005 | ||
| 8:00 AM-12:00 PM | ||
| Fault Isolation 1 | ||
| MEMS | ||
| Packaging 2 | ||
| 1:00 PM-3:30 PM | ||
| Fault Isolation 2 | ||
| 1:00 PM-4:15 PM | ||
| Device and Test 3 | ||
| 1:00 PM-6:15 PM | ||
| Microscopy Tools 3 | ||
| 3:45 PM-6:15 PM | ||
| Failure Mechanisms | ||
| 4:15 PM-6:15 PM | ||
| Failure Analysis Laboratory Management | ||
| 6:15 PM-6:30 PM | ||
| Prize Drawing | ||