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Sunday, November 6, 2005 | ||
8:00 AM-8:10 AM | ||
Introduction | ||
8:15 AM-10:30 AM | ||
Failure Analysis Basics | ||
8:15 AM-12:00 PM | ||
Device and Test 1 | ||
Packaging 1 | ||
10:30 AM-12:00 PM | ||
Microscopy Tools 1 | ||
1:00 PM-3:30 PM | ||
Yield | ||
1:00 PM-6:30 PM | ||
Device and Test 2 | ||
Microscopy Tools 2 | ||
3:30 PM-6:30 PM | ||
Sample Preparation | ||
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Monday, November 7, 2005 | ||
8:00 AM-12:00 PM | ||
Fault Isolation 1 | ||
MEMS | ||
Packaging 2 | ||
1:00 PM-3:30 PM | ||
Fault Isolation 2 | ||
1:00 PM-4:15 PM | ||
Device and Test 3 | ||
1:00 PM-6:15 PM | ||
Microscopy Tools 3 | ||
3:45 PM-6:15 PM | ||
Failure Mechanisms | ||
4:15 PM-6:15 PM | ||
Failure Analysis Laboratory Management | ||
6:15 PM-6:30 PM | ||
Prize Drawing |