Photonic Localization Techniques covers techniques for die level analysis of functional anomalies based on optical interactions with the DUT, like photon emission, laser stimulation techniques and thermographic techniques that convert the temperature profile into an optical contrast. Photon emission, the most important technique to localize active device performance and anomalies, will be presented in theory and application. Starting with the physics behind the phenomena for a classification of the effects...over specialities for application through chip backside...to low voltage application, all the important issues will be covered. Scanning laser based techniques will also be discussed. For names like OBIC, LIVA, LADA, TLS, OBIRCH, TIVA, XIVA, SDL, RIL and SEI, the common grounds and the distinctions will be made comprehensible with a set of modules and their composition. A short description of thermographic techniques based on optical contrasts will be included, and will match with the special tutorial of that topic.