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| Session 24: Test | ||||
| Location: Meeting Room J3 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: This two paper test topic session addresses diagnosis methodologies for fault isolation and defect identification. Internal scan chain diagnosis is an evolving capability for merging design, test, and failure analysis tools and resources to solve critical yield and reliability issues. The first paper presents scan diagnosis for fault type evaluation and localization to focus failure analysis efforts, decrease root cause determination cycle time, and increase success rate. The second paper introduces two strategies for scan chain fault classes including multiple stuck-at and timing faults. These involve scan chain load/unload analysis for passing/failing conditions and logic state mapping utilizing off-state leakage current profiling. | ||||
| Editors: | Dr. Rob Aitken Artisan Components, Sunnyvale, CA Ms. Anne Gattiker IBM Corporation, Austin, TX Dr. Chuck Hawkins University of New Mexico, Albuquerque, NM Dr. Rene Segers Philips Semiconductor, Eindhoven, Netherlands Jerry M. Soden Sandia National Labs, Albuquerque, NM Dr. Martin Versen University of Applied Sciences Rosenheim, Rosenheim, Germany Anjali Vij Texas Instruments, Stafford, TX | |||
| Session Chair: | Dr. Martin Versen University of Applied Sciences Rosenheim, Rosenheim, Germany | |||
| 3:25 PM | SYMP0523.4 | Advanced Scan Diagnosis Based Fault Isolation and Defect Identification for Yield Learning | ||
| 3:50 PM | SYMP0523.6 | Diagnosis of Multiple Scan Chain Faults | ||