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Symposium

Monday, November 7, 2005
7:00 PM-8:30 PM
Scanning Optical Microscopy (SOM) User Group
Tuesday, November 8, 2005
9:25 AM-10:40 AM
Session 1: Advanced Techniques 1
11:00 AM-12:40 PM
Session 2: Package Level Analysis 1
Session 3: Die Level Fault Isolation
1:00 PM-2:40 PM
Session 4: Panel Discussion 1: Strategic Development in FA. What Can We Get From Other Technical Sources?
Session 5: Panel Discussion 2: Can Competitors Build Some Common FA Facilities To Improve ROI And Efficiency?
3:00 PM-4:40 PM
Session 6: Circuit Edit for FA, FI, and Debug
Session 7: Case Histories 1
4:45 PM-5:15 PM
EDFAS General Membership Meeting
7:00 PM-8:30 PM
Focused Ion Beam (FIB) User Group
Scanning Probe Microscopy (SPM) User Group
Wednesday, November 9, 2005
8:00 AM-9:40 AM
Session 8: Optical Techniques 1
Session 9: System Level Analysis 1
10:00 AM-11:15 AM
Session 10: Advanced Techniques 2
Session 11: Case Histories 2
11:15 AM-1:15 PM
Session 12: Poster/Luncheon
2:15 PM-3:55 PM
Session 13: Failure Analysis Process
Session 14: SPM Techniques 1
4:15 PM-5:55 PM
Session 15: Sample Preparation 1
Session 16: Optoelectronic Devices
7:00 PM-8:30 PM
Chip Access/Delayering User Group
Nano Probe User Group
Thursday, November 10, 2005
8:00 AM-9:15 AM
Session 17: Optical Techniques 2
Session 18: Nanotechnology Analysis
9:25 AM-11:30 AM
Session 19: Yield Enhancement
Session 20: Discretes, Passives, and MEMS
1:00 PM-3:05 PM
Session 21: Metrology and Materials Analysis
Session 22: System Level 2/Packaging 2/SPM 2
3:25 PM-4:40 PM
Session 23: Sample Preparation 2
Session 24: Test