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| Failure Mechanisms | ||||
| Location: Meeting Room J2 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Editor: | Mr. Jeremy A. Walraven Sandia National Labs, Albuquerque, NM | |||
| Session Chair: | Dr. Leo G. Henry ESD-TLP Consulting & Testing, Fremont,, CA | |||
| 3:45 PM | GEN0512.1 | Electromigration in Copper Interconnects – Failure Analysis and Degradation Studies | ||
| 5:15 PM | GEN0512.2 | Physics of Failure – The Good Part about Bad Parts | ||