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| Session 10: Advanced Techniques 2 | ||||
| Location: Meeting Room J1-J2 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: This session is a continuation of Advanced Techniques 1. | ||||
| Editors: | Rajen Dias Intel Corporation, Chandler, AZ Dr. William K. Lo DCG Systems, Fremont, CA Dr. Antonio Orozco Neocera, Inc., Beltsville, MD Mr. Mike Twiford Agere, Allentown, PA Mr. David Vallett IBM Systems and Technology Group, Essex Jct., VT Dr. Zhiyong Wang Intel Corporation, Chandler, AZ | |||
| Session Chair: | Dr. William K. Lo DCG Systems, Fremont, CA | |||
| 10:00 AM | SYMP059.2 | X-ray Fluorescence Imaging for High Resolution Elemental Mapping | ||
| 10:25 AM | SYMP059.1 | 3-D EBIC Technique using FIB and EB Double Beam System | ||
| 10:50 AM | SYMP059.3 | Analysis of a Microcircuit Failure using SQUID and MR Current Imaging | ||